The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 19, 2023

Filed:

Apr. 23, 2021
Applicants:

Mettler-toledo (Changzhou) Precision Instruments Ltd, Changzhou, CN;

Mettler-toledo (Changzhou) Measurement Technology Ltd., Changzhou, CN;

Mettler-toledo International Trading (Shanghai) Co., Ltd., Shanghai, CN;

Inventors:

Shenhui Wang, Changzhou, CN;

Huifang Wu, Changzhou, CN;

Ming Cai, Changzhou, CN;

Qi Han, Changzhou, CN;

Dongjie Qiu, Changzhou, CN;

Wenjun Jiang, Changzhou, CN;

Jindong Cui, Changzhou, CN;

Bin Zhu, Changzhou, CN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01G 11/00 (2006.01); G01G 15/00 (2006.01); G01G 19/387 (2006.01); G01G 23/01 (2006.01);
U.S. Cl.
CPC ...
G01G 15/006 (2013.01); G01G 11/006 (2013.01); G01G 19/387 (2013.01); G01G 23/01 (2013.01);
Abstract

A method and a system measure interfering influences on a checkweighing device. In the method, external interference data are obtained, as are interference data from the checkweighing device itself and interference data from an object being weighed, by calculating or mapping the weighing error data in the stationary state, in the operating state, and in the weighing state. The system for measuring the interference uses a meter and a processing apparatus. The meter and the processing apparatus perform an interference measurement and a compensation method. The amount of interference in the checkweighing device in each state and the amount of influence of the interference on the weighing performance is obtained, thereby facilitating the production, debugging, maintenance, and use of a checkweighing device.


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