Company Filing History:
Years Active: 2023
Title: **Innovator Dongjie Qiu and His Contributions to Checkweighing Technology**
Introduction
Dongjie Qiu, based in Changzhou, China, is a notable inventor recognized for his innovative work in the field of measurement technology. With a strong background in engineering, he has made significant contributions that aim to improve the functionality and reliability of checkweighing devices.
Latest Patents
He holds a patent for a "Method and system for measuring interference in a checkweighing device." This innovative method and system are designed to address and quantify interfering influences on checkweighing devices. It works by obtaining interference data from various sources including the device itself and the object being weighed. The methodology involves calculating or mapping the weighing error data in different operational states, thus facilitating improved debugging, maintenance, and accurate readings in checkweighing applications.
Career Highlights
Throughout his career, Dongjie Qiu has been associated with reputable companies, including Mettler Toledo (Changzhou) Precision Instruments Ltd. and Mettler Toledo (Changzhou) Measurement Technology Ltd. His experience at these organizations has bolstered his expertise in precision instruments and measurement technology, enabling him to create impactful innovations in the industry.
Collaborations
Dongjie has collaborated with notable professionals in his field, including Shenhui Wang and Huifang Wu. Together, they have worked on research and development initiatives that contribute to advancing technology in weighing systems, enhancing accuracy and efficiency in industrial applications.
Conclusion
Dongjie Qiu is a distinguished inventor whose work has significantly impacted the checkweighing industry. His innovative patent reflects a commitment to enhancing measurement accuracy by addressing interference issues in weighing devices. Through his career, he continues to inspire advancements in technology, making a lasting contribution to the field of precision measurement.