Jin Wen

Title: Innovations of Jin Wen in Optical Metrology

Introduction

Jin Wen is an accomplished inventor based in Sunnyvale, CA. He has made significant contributions to the field of optical metrology, particularly in the modeling of semiconductor wafer structures. His innovative approach has led to the development of a unique patent that enhances the accuracy of optical measurements.

Latest Patents

Jin Wen holds a patent titled "Selecting a hypothetical profile to use in optical metrology." This patent involves using a hypothetical profile to model the structure of a semiconductor wafer. The process includes obtaining sample diffraction signals from measured diffraction signals of structures formed on the wafer. By defining and evaluating a hypothetical profile using these sample diffraction signals, Jin's invention improves the determination of the profile of the structure through optical metrology.

Career Highlights

Jin Wen is currently employed at Timbre Technologies, Inc., where he continues to push the boundaries of innovation in his field. His work has been instrumental in advancing optical measurement techniques, making significant impacts in semiconductor technology.

Collaborations

Jin collaborates with talented coworkers, including Vi Vuong and Junwei Bao. Their combined expertise fosters a creative environment that drives innovation and enhances the development of new technologies.

Conclusion

Jin Wen's contributions to optical metrology exemplify the spirit of innovation in the semiconductor industry. His patent and ongoing work at Timbre Technologies, Inc. highlight his commitment to advancing technology and improving measurement accuracy.