This inventor holds 1 USPTO granted patent. Top assignees: Koh Young Technology Inc., Korea Advanced Institute of Science and Technology. Active years: 2022.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:


Years Active: 2022
Title: Jin Man Park: Innovator in Substrate Inspection Technology
Introduction
Jin Man Park is a notable inventor based in Daejeon, South Korea. He has made significant contributions to the field of substrate inspection technology, particularly through his innovative patent. His work focuses on improving the accuracy and efficiency of fault detection in screen printing processes.
Latest Patents
Jin Man Park holds a patent for a "Substrate inspection apparatus and method of determining fault type of screen printer." This invention involves a substrate inspection apparatus that generates images indicating anomalies in solder pastes printed on a substrate. The apparatus utilizes machine learning to analyze these images, determining fault types and associated solder pastes. This technology enhances the reliability of screen printing by accurately identifying and categorizing faults.
Career Highlights
Throughout his career, Jin Man Park has worked with prominent organizations, including Koh Young Technology Inc. and the Korea Advanced Institute of Science and Technology. His experience in these institutions has allowed him to develop and refine his innovative ideas in substrate inspection technology.
Collaborations
Jin Man Park has collaborated with talented individuals such as Jong Hwan Kim and Juyoun Park. These partnerships have contributed to the advancement of his research and the successful implementation of his inventions.
Conclusion
Jin Man Park's contributions to substrate inspection technology demonstrate his commitment to innovation and excellence. His patent reflects a significant advancement in the field, showcasing his expertise and dedication to improving manufacturing processes.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile