Jim Woodruff

Title: Jim Woodruff: Innovator in Substrate Measurement Technology

Introduction

Jim Woodruff is a notable inventor based in San Jose, CA. He has made significant contributions to the field of substrate measurement technology. With a total of 3 patents, Woodruff has demonstrated his expertise and innovative spirit in developing advanced measurement apparatuses.

Latest Patents

One of Woodruff's latest patents is the "Dual-sided substrate measurement apparatus and methods." This innovative apparatus is designed to measure the relative positions of frontside and backside alignment marks located on opposite sides of a substrate. The apparatus features upper and lower optical systems that enable simultaneous imaging of both frontside and backside alignment marks. The images captured are processed to determine the relative position of the marks, providing a measurement of the alignment and overlay performance of the tool that formed the marks on the substrate.

Career Highlights

Jim Woodruff is currently employed at Ultratech, Inc., where he continues to push the boundaries of technology in substrate measurement. His work has been instrumental in enhancing the precision and efficiency of measurement techniques in the industry.

Collaborations

Throughout his career, Woodruff has collaborated with talented individuals such as Albert J Crespin and Ray Ellis. These collaborations have contributed to the development of innovative solutions in the field.

Conclusion

Jim Woodruff's contributions to substrate measurement technology highlight his role as a leading inventor in the industry. His innovative patents and collaborations reflect his commitment to advancing measurement techniques.