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Hsinchu, Taiwan

Jih-San Lee

This inventor holds 4 USPTO granted patents. Top assignee: United Microelectronics Corp.. Active years: 2012-2026.

USPTO Granted Patents = 4

% Patents Active = 100.0

Average Co-Inventor Count = 4.4

ph-index = 1

Forward Citations = 3(Granted Patents)

Company Filing History:

United Microelectronics Corp.

Years Active: 2012-2026

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4 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 12751091 - Electrostatic discharge protection circuit using GaN-based devices (2026-09-29),

2. 12609527 - Electrostatic discharge protection circuit using GaN-based devices (2026-04-21),

3. 12588293 - Electrostatic discharge protection circuit using GaN-based devices (2026-03-24),

4. 8283941 - Alternating current (AC) stress test circuit, method for evaluating AC stress induced hot carrier injection (HCI) degradation, and test structure for HCI degradation evaluation (2012-10-09),

Profile summary based on public USPTO records.

Please report any incorrect information to [email protected]

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