This inventor holds 1 USPTO granted patent. Top assignee: Kla Tencor Corporation. Active years: 2015.
Company Filing History:
Years Active: 2015
Title: Jien Cao: Innovator in Wafer Inspection Technology
Introduction
Jien Cao is a notable inventor based in Fremont, California. He has made significant contributions to the field of wafer inspection technology. His innovative work has led to the development of a patent that enhances the efficiency and accuracy of wafer inspections.
Latest Patents
Jien Cao holds a patent for "Monitoring incident beam position in a wafer inspection system." This patent describes methods, systems, and structures for monitoring the incident beam position in a wafer inspection system. One of the key features includes a chuck designed to support a wafer during inspection. The chuck is capable of rotating the wafer in a theta direction while simultaneously translating it in a radial direction. The alignment of the axis through the center of the feature with the radius of the chuck allows for precise monitoring of changes in the incident beam position.
Career Highlights
Jien Cao is currently employed at KLA-Tencor Corporation, a leading company in the semiconductor industry. His work at KLA-Tencor focuses on advancing technologies that improve wafer inspection processes. With a total of 1 patent, he has established himself as a valuable contributor to the field.
Collaborations
Throughout his career, Jien has collaborated with talented professionals, including Bret Whiteside and Juergen Reich. These collaborations have further enriched his work and contributed to the development of innovative solutions in wafer inspection technology.
Conclusion
Jien Cao's contributions to wafer inspection technology exemplify the impact of innovation in the semiconductor industry. His patent and work at KLA-Tencor Corporation highlight his commitment to advancing technology and improving inspection processes.