Hsinchu, Taiwan

Jia-Ming Guo

USPTO Granted Patents = 4 

Average Co-Inventor Count = 4.4

ph-index = 1


Company Filing History:


Years Active: 2022-2025

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4 patents (USPTO):Explore Patents

Title: Innovations of Jia-Ming Guo

Introduction

Jia-Ming Guo is a notable inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of semiconductor testing and has been awarded 4 patents for his innovative work. His inventions focus on improving the reliability and efficiency of logic devices.

Latest Patents

One of his latest patents is titled "Method and apparatus for detecting defective logic devices." This invention provides an apparatus for testing a device under test (DUT), which includes a power supply device and a data generating device. The power supply device is designed to provide two different voltages to the DUT at specified time durations. The data generating device supplies data to the DUT during the first time duration, ensuring accurate testing of the device's functionality.

Another significant patent is the "Circuit screening system and circuit screening method." This system includes a target circuit under test that receives testing signals in two distinct periods. The power circuit maintains a supply voltage at a specific level during these periods, while a clock generating circuit provides a clock signal to trigger the testing process. This innovative approach enhances the accuracy of circuit testing.

Career Highlights

Jia-Ming Guo is currently employed at Taiwan Semiconductor Manufacturing Company Limited, a leading firm in the semiconductor industry. His work at this company has allowed him to develop and refine his inventions, contributing to advancements in semiconductor technology.

Collaborations

He has collaborated with notable colleagues such as Chi-Che Wu and Tsung-Yang Hung. Their teamwork has fostered an environment of innovation and has led to the successful development of various testing methodologies.

Conclusion

Jia-Ming Guo's contributions to the field of semiconductor testing are noteworthy. His innovative patents reflect his commitment to enhancing the reliability of logic devices. His work continues to influence the industry positively.

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