Hsinchu, Taiwan

Jhen-Hong Lin

This inventor holds 1 USPTO granted patent. Top assignee: Taiwan Semiconductor Manufacturing Comp. Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jhen-Hong Lin. Retrieved from https://idiyas.com/inventor/jhen-hong-lin

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Jhen-Hong Lin: Semiconductor Interconnect Invention.

Introduction

Jhen-Hong Lin is an inventor associated with Hsinchu, Taiwan, and Taiwan Semiconductor Manufacturing Company Limited. His listed patent work concerns silicon interconnect technology and through-substrate vias.

Latest Patents

Lin is credited with 1 patent: “Shielded Through-Substrate Via Structures for Silicon Interconnect Die.” The invention describes a silicon interconnect die with through-substrate via structures extending through a silicon substrate. An insulating spacer layer includes a portion over the substrate’s top surface and tubular portions surrounding the vias. A front metallic shield layer includes a horizontal shield portion and tubular portions surrounding the insulating material.

Career Highlights

The available information connects Lin’s invention work with Taiwan Semiconductor Manufacturing Company Limited and semiconductor interconnect design. The patent focuses on insulating and metallic shielding structures around through-substrate vias.

Collaborations

Lin’s listed coworkers include Cheng-Ming Yu and Mochtar Chandra. Their names are associated with his professional and patent context.

Conclusion

Jhen-Hong Lin’s recorded patent contribution addresses shielded through-substrate vias, combining insulating spacers and metallic shielding in a silicon interconnect die.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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