Tonawanda, NY, United States of America

Jerry J Spongr


Average Co-Inventor Count = 2.7

ph-index = 5

Forward Citations = 56(Granted Patents)


Company Filing History:


Years Active: 1982-1992

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11 patents (USPTO):Explore Patents

Title: Jerry J Spongr: Innovator in Coating Measurement Technology

Introduction

Jerry J Spongr is a notable inventor based in Tonawanda, NY (US), recognized for his contributions to the field of coating measurement technology. With a total of 11 patents to his name, Spongr has developed innovative solutions that enhance the accuracy and efficiency of measuring coatings on various materials.

Latest Patents

Among his latest patents, Spongr has designed an apparatus for measuring the thickness of a coating on an elongate strip of material. This apparatus features a measuring device mounted on a shuttle that moves parallel to the strip, ensuring precise measurements as the material travels along a predetermined path. The shuttle is equipped with a target-spotting device, allowing for accurate positioning based on signals received during operation.

Another significant patent involves a measuring apparatus that utilizes X-ray fluorescence to determine the thickness of a coating on a workpiece. This sophisticated device includes an X-ray tube, a shutter, and collimator means, all mounted on a frame. The design allows for the workpiece to be moved in multiple orientations, facilitating precise measurements of the coating thickness.

Career Highlights

Throughout his career, Jerry J Spongr has worked with various companies, including Twin City International, Inc. His experience in the industry has contributed to his expertise in developing advanced measurement technologies.

Collaborations

Spongr has collaborated with notable individuals in his field, including John E Tiebor and Boris B Joffe. These partnerships have likely fostered innovation and the exchange of ideas, further enhancing his contributions to coating measurement technology.

Conclusion

Jerry J Spongr's work in developing innovative measurement apparatuses has significantly impacted the industry. His patents reflect a commitment to precision and efficiency in coating measurement, establishing him as a key figure in this technological domain.

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