The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 29, 1984

Filed:

May. 20, 1982
Applicant:
Inventors:

Jerry J Spongr, Tonawanda, NY (US);

Byron E Sawyer, N. Tonawanda, NY (US);

Assignee:

Twin City International, Inc., Amherst, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
250308 ; 2503591 ; 2503601 ;
Abstract

Apparatus using radiation techniques for measuring coating thickness on continuously moving strip material as it travels along a predetermined path and without altering that path. A shuttle carrying a measuring probe having a radioactive isotope source and a detection device is provided in the path of the strip for reciprocation along a preselected segment of the path. The shuttle and the probe are releasably engaged with the strip and carried thereby for synchronous movement therewith in the direction of travel of the strip during a measurement cycle, and are disengaged from the strip when no measurement is being made, the movement of the shuttle then being controlled by an independent drive mechanism. The shuttle includes a strip guide plate which is tiltable about an axis substantially parallel to the longitudinal axis of the strip in order to orient the surface having the coating so it can be properly presented to the measuring probe.


Find Patent Forward Citations

Loading…