Byron E Sawyer

Title: Byron E. Sawyer: Innovator in Coating Measurement Technology

Introduction

Byron E. Sawyer is a notable inventor based in North Tonawanda, NY (US). He has made significant contributions to the field of measurement technology, particularly in the area of coating thickness measurement. With a total of 5 patents to his name, Sawyer's work has advanced the capabilities of measuring devices used in various industrial applications.

Latest Patents

One of Sawyer's latest inventions is an apparatus for measuring the thickness of a coating on a workpiece using X-ray fluorescence. This innovative device includes a frame that supports an X-ray tube, a shutter, and collimator means, along with a signal detector and a viewing device. The apparatus is designed to move the workpiece in multiple orientations, allowing for precise measurements of coating thickness. Another significant patent involves an apparatus for measuring the thickness of a coating on a continuously moving strip of material. This device features a shuttle that engages with the moving strip, enabling accurate measurements while the material is in motion.

Career Highlights

Byron E. Sawyer is currently associated with Twin City International, Inc., where he continues to develop and refine measurement technologies. His work has been instrumental in enhancing the efficiency and accuracy of coating measurement processes in various industries.

Collaborations

Sawyer has collaborated with notable colleagues such as Jerry J. Spongr and Boris B. Joffe, contributing to the advancement of measurement technologies through teamwork and shared expertise.

Conclusion

Byron E. Sawyer's innovative contributions to coating measurement technology have established him as a key figure in the field. His patents reflect a commitment to improving measurement accuracy and efficiency, making a lasting impact on industrial applications.