The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 28, 1984

Filed:

Aug. 09, 1982
Applicant:
Inventors:

Jerry J Spongr, Tonawanda, NY (US);

John E Tiebor, Williamsville, NY (US);

Boris N Ivasyuk, Tonawanda, NY (US);

Assignee:

Twin City International, Inc., Amherst, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
250308 ; 7315 / ;
Abstract

A coating thickness measuring apparatus for step and repeat coating systems, including; a support member; a common support assembly mounted for pivotal movement about and along a vertical axis; a measuring probe carried by the common support assembly and movable with respect thereto along a horizontal axis; a calibrating disc carried by the common support assembly for rotation with respect thereto about a horizontal axis, having an opening for reception therethrough of the probe and having a plurality of angularly spaced calibration standards movable into selective alignment with the probe; actuators for moving the probe along its horizontal axis, for vertically moving the common support assembly and for rotating the calibration disc; stroke limiting means to halt probe movement between its extreme positions; an indexing bar having a plurality of variably spaced openings; an indexing pin for securing the support member into one of the indexing bar openings; and sensing switches developing signals indicative of the positions of various moving components of the apparatus.


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