This inventor holds 1 USPTO granted patent. Top assignee: K. C. Tech Co., Ltd.. Active years: 2007.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2007
Title: Innovations by Jeong-Ho Lee in Wafer Cleaning Technology.
Introduction
Jeong-Ho Lee is a notable inventor based in Inchon Metropolitan, South Korea. He has made significant contributions to the field of semiconductor manufacturing, particularly in the area of wafer cleaning technology. His innovative approach aims to enhance the efficiency and yield rates of wafer production.
Latest Patents
Jeong-Ho Lee holds a patent for an "Apparatus for cleaning the edges of wafers." This invention addresses the challenges associated with wafer contamination during the cleaning process. The apparatus is designed to be relatively simple and cost-effective, preventing re-contamination of the wafer edges and ultimately increasing the yield rate of wafers. The device features a cleaning agent ejection nozzle body that is strategically positioned on a chuck, allowing for the ejection of a particulate cleaning agent towards the side and edge portions of the wafer as it is held and rotated.
Career Highlights
Throughout his career, Jeong-Ho Lee has been associated with K. C. Tech Co., Ltd., where he has played a pivotal role in advancing wafer cleaning technologies. His work has not only contributed to the company's success but has also positioned him as a key figure in the semiconductor industry.
Collaborations
Jeong-Ho Lee has collaborated with talented individuals such as Se-Jong Ko and Jung-Gwan Kim. These partnerships have fostered innovation and have been instrumental in the development of cutting-edge technologies in wafer processing.
Conclusion
Jeong-Ho Lee's contributions to wafer cleaning technology exemplify the importance of innovation in the semiconductor industry. His patented apparatus represents a significant advancement that addresses critical challenges in wafer production. Through his work, he continues to influence the field and drive improvements in manufacturing processes.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
