Campbell, CA, United States of America

Jennming James Chen


Average Co-Inventor Count = 9.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 2007

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1 patent (USPTO):Explore Patents

Title: Inventor Spotlight: Jennming James Chen

Introduction

Jennming James Chen, based in Campbell, CA, is an innovative inventor recognized for his contributions in the field of thin film analysis. With a keen understanding of energy beam applications, Chen has developed systems and methods that enhance material analysis techniques.

Latest Patents

Chen holds a patent titled "Methods and Systems for Preparing a Sample for Thin Film Analysis." This patent describes a system that includes an energy beam source designed to generate an energy beam. It also details an energy beam delivery subsystem that directs the energy beam to a sample, modifying it to achieve a substantially flat-top profile. This innovative approach allows the energy beam to effectively remove a portion of a contaminant layer on the sample, thereby exposing an analysis area of a thin film for comprehensive evaluation.

Career Highlights

As an integral member of Kla-Tencor Technologies Corporation, Chen has made significant contributions to the development of advanced analytical tools and systems. His dedication to enhancing thin film analysis methodologies demonstrates his commitment to improving research capabilities within the industry.

Collaborations

Throughout his career, Jennming James Chen has had the opportunity to work alongside distinguished colleagues, including James McWhirter and Liang-Guo Wang. These collaborations reflect a shared commitment to innovation and excellence in their respective fields.

Conclusion

Jennming James Chen's inventive work on methods and systems for thin film analysis showcases his expertise and commitment to advancing technology. His contributions at Kla-Tencor Technologies Corporation highlight the impact that innovative thinking can have on research and development, paving the way for future advancements in material analysis.

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