Knoxville, TN, United States of America

Jennifer Hay

This inventor holds 3 USPTO granted patents. Top assignees: Agilent Technologies, Inc., Kla Tencor Corporation, Nanonmechanics, Inc.. Active years: 2010-2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jennifer Hay. Retrieved from https://idiyas.com/inventor/jennifer-hay

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 1.7

ph-index = 2

Forward Citations = 51(Granted Patents)


Company Filing History:


Years Active: 2010-2019

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3 patents (USPTO):Explore Patents

Title: The Innovations of Jennifer Hay: Pioneering Instrumented Indentation Technologies

Introduction

Jennifer Hay, an innovative inventor based in Knoxville, TN, has made significant contributions to the field of materials science through her groundbreaking patents. With a total of three patents to her name, she has been instrumental in developing advanced methods and devices that enhance the capabilities of instrumented indentation, a technique essential for understanding material properties.

Latest Patents

Jennifer Hay's latest inventions include two notable patents. The first is an "Instrumented indentation apparatus having indenter punch with flat end surface and instrumented indentation method using the same." This apparatus employs a flat-ended indenter to collect force-displacement data during the indentation process. Using the known value of the effective radius of the indenter's end surface, it allows for the accurate calculation of stress and strain, ultimately producing the entire stress-strain curve for the sample being tested.

The second patent is for a "Scanning probe microscope with independent force control and displacement measurements." This device features a nanoindenter that integrates an interferometer, rod, force actuator, and a controller. The interferometer generates a light beam that reflects off a movable reflector, which helps in measuring the distance between a reference location and the reflector. This invention has valuable applications as a scanning probe microscope, pushing the boundaries of precision in material characterization.

Career Highlights

Jennifer has had a successful career, featuring key roles at renowned companies such as Agilent Technologies and KLA-Tencor Corporation. Her work at these organizations not only honed her technical skills but also allowed her to collaborate on cutting-edge technologies that advance research in materials science.

Collaborations

Throughout her career, Jennifer has collaborated with notable professionals including Warren C. Oliver and John Swindernan. These partnerships have fostered an environment of creativity and innovation, enabling the development of her notable patents that address complex challenges in the field.

Conclusion

Jennifer Hay stands out as a prominent inventor in the realm of instrumented indentation technologies. Her innovative patents have the potential to significantly impact various applications in materials science and engineering. As she continues to push the boundaries of her field, Jennifer remains a vital contributor to advancements in understanding material properties and their applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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