The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 23, 2010

Filed:

Dec. 12, 2006
Applicants:

Jennifer Hay, Knoxville, TN (US);

Warren Oliver, Knoxville, TN (US);

Inventors:

Jennifer Hay, Knoxville, TN (US);

Warren Oliver, Knoxville, TN (US);

Assignee:

Agilent Technologies, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 3/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

Concepts presented herein relate to a portable device that includes a frame and a fixture for engaging a mechanical probe to be calibrated. The fixture can be a platform of hard material that receives pushing action of the mechanical probe. A displacement sensor senses position of the platform with respect to the frame. An actuator is coupled to the displacement sensor and a controller is coupled to the actuator. The controller operates the actuator to cause the platform to move to a position (as indicated by the displacement sensor), while the force required to cause the displacement is measured with a force sensor.


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Hay, Jennifer. (2010). Calibrating force and displacement sensors of mechanical probes (U.S. Patent No. 7681432). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7681432

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