Zhubei, Taiwan

Jen-Chieh Yeh

This inventor holds 2 USPTO granted patents and 1 EPO patent. Top assignee: Intel Corporation. Active years: 2015-2016.



Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 2015-2016

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2 patents (USPTO):Explore Patents

Title: Innovations of Inventor Jen-Chieh Yeh

Introduction

Jen-Chieh Yeh is a notable inventor based in Zhubei, Taiwan. He has made significant contributions to the field of dynamic random access memory (DRAM) technology. With a total of 2 patents, his work has advanced the understanding and functionality of memory systems.

Latest Patents

Jen-Chieh Yeh's latest patents focus on techniques for accessing a dynamic random access memory array. These patents disclose examples for accessing a DRAM array, where sub-arrays of a DRAM bank can open multiple pages responsive to the same column address strobe. Additionally, the patents describe arrangements where input/output (IO) bits are routed in a serialized manner over an IO wire. This IO wire may pass through a DRAM die that includes the DRAM bank or may connect to a memory channel or bus outside of the DRAM die. Other examples are also described and claimed in his patents.

Career Highlights

Jen-Chieh Yeh is currently employed at Intel Corporation, a leading technology company known for its innovations in semiconductor manufacturing and computing technology. His work at Intel has allowed him to contribute to cutting-edge advancements in memory technology.

Collaborations

Throughout his career, Jen-Chieh Yeh has collaborated with talented individuals such as Andre Schaefer and Pei-Wen Luo. These collaborations have fostered an environment of innovation and creativity in the field of memory technology.

Conclusion

Jen-Chieh Yeh's contributions to DRAM technology through his patents and work at Intel Corporation highlight his role as a significant inventor in the field. His innovative techniques continue to influence advancements in memory systems.

Profile summary based on public USPTO records.
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