Simi Valley, CA, United States of America

Jeffrey Wong

USPTO Granted Patents = 5 

Average Co-Inventor Count = 1.4

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2020-2024

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5 patents (USPTO):Explore Patents

Title: Innovations of Jeffrey Wong in Surface Analysis Technology

Introduction

Jeffrey Wong is a notable inventor based in Simi Valley, California, recognized for his contributions to surface analysis technology. With a total of five patents to his name, Wong has made significant advancements in the field, particularly in the design and fabrication of probes for atomic force microscopes (AFMs).

Latest Patents

One of Wong's latest patents is the "Large Radius Probe," which is designed for use in surface analysis instruments such as AFMs. This probe features a microfabricated tip with a hemispherical distal end, with an apex radius of about a micron. This design makes the probes particularly useful for nanoindentation analyses, while also allowing for imaging applications, especially in semiconductor samples. The batch fabrication process enhances both cost-effectiveness and robustness.

Another significant patent is the "Metrology Probe with Built-in Angle and Method of Fabrication Thereof." This invention outlines a method for batch-fabricating an array of probe devices for AFMs. The process involves providing a wafer and photolithographically forming a base and cantilever for each probe. The cantilever is designed with a built-in angle relative to the base, ensuring that the base remains parallel to the sample holder when mounted in the probe holder of the surface analysis instrument.

Career Highlights

Wong is currently employed at Bruker Nano GmbH, a company known for its innovative solutions in nanotechnology and materials analysis. His work at Bruker has allowed him to push the boundaries of surface analysis technology, contributing to advancements that benefit various scientific and industrial applications.

Collaborations

Throughout his career, Wong has collaborated with esteemed colleagues such as Deepkishore Mukhopadhyay and Joseph S. Fragala. These collaborations have fostered a productive environment for innovation and have led to the development of cutting-edge technologies in the field.

Conclusion

Jeffrey Wong's contributions to surface analysis technology through his innovative patents and work at Bruker Nano GmbH highlight his significant role in advancing the field. His inventions, particularly in probe design, continue to impact various applications in science and industry.

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