San Jose, CA, United States of America

Jeffrey Johnson

This inventor holds 1 USPTO granted patent. Top assignee: Verigy (Singapore) Pte. Ltd.. Active years: 2010.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jeffrey Johnson. Retrieved from https://idiyas.com/inventor/jeffrey-johnson-57wrayvx

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2010

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1 patent (USPTO):Explore Patents

Title: Jeffrey Johnson: Inventor in Test Equipment

Introduction

Jeffrey Johnson is an inventor associated with San Jose, California, and Verigy (Singapore) Pte. Ltd. His patent work addresses ways to inspect and modify the operating state of test equipment.

Latest Patents

The supplied information identifies one patent associated with Johnson: “Graphically extensible, hardware independent method to inspect and modify state of test equipment.” The invention describes a hardware-independent technique that uses a descriptor file to represent test equipment architecture, invokes plugins for its subsystems, and displays a map with drill-down controls for viewing and modifying subsystem states. Johnson is credited with 1 patent.

Career Highlights

Johnson’s listed work connects him with Verigy (Singapore) Pte. Ltd. The patent’s focus on extensible, hardware-independent inspection reflects an approach to interacting with complex test equipment through subsystem-specific plugins.

Collaborations

The supplied information names Ben Rogel-Favila and Alan Howard Davis as Johnson’s coworkers. Their specific roles in the patent or related work are not provided.

Conclusion

Jeffrey Johnson’s identified patent presents a graphical, plugin-based method for inspecting and modifying test equipment, highlighting his contribution to tools for managing equipment state.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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