The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 14, 2010

Filed:

May. 11, 2006
Applicants:

Jeffrey Johnson, San Jose, CA (US);

Ben Rogel-favila, Santa Clara, CA (US);

Alan Davis, Mountain View, CA (US);

Inventors:

Jeffrey Johnson, San Jose, CA (US);

Ben Rogel-Favila, Santa Clara, CA (US);

Alan Davis, Mountain View, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A hardware independent and graphically extensible tester state browsing technique for observing and modifying operating state of test equipment includes accessing a descriptor file describing an architecture of the test equipment, invoking a set of plugins associated with one or more subsystems of the test equipment, and displaying a map with a set of drill-down mechanisms each associated with different ones of the subsystems of the test equipment which invoke the respective plugin associated with its corresponding respective subsystem.


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Johnson, Jeffrey. (2010). Graphically extensible, hardware independent method to inspect and modify state of test equipment (U.S. Patent No. 7853828). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7853828

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