Company Filing History:
Years Active: 1994-1999
Title: Innovations by Jean Canteloup
Introduction
Jean Canteloup is a notable inventor based in Monthlery, France. He has made significant contributions to the field of three-dimensional measurements and observation technologies. With a total of 4 patents, his work has advanced the capabilities of thin-film structure analysis.
Latest Patents
Canteloup's latest patents include a device and method for three-dimensional measurements and observation of a surface layer of a thin-film structure. This innovative device features a monitoring unit that includes a video camera, a wide-beam illumination source, a narrow-beam illumination source, an operation and control unit, and a table for horizontal movement. The device utilizes a Wollaston prism to create two narrow light beams with linear and mutually orthogonal polarization states. Additionally, he has developed a method and device for in situ quantification by reflectometry, which involves sending an illumination beam onto a localized region of the surface layer of a thin-film structure being etched in a vacuum processing chamber.
Career Highlights
Throughout his career, Jean Canteloup has worked with various companies, including Sofie and Instruments S.A. His innovative approaches have led to advancements in measurement technologies, making him a respected figure in his field.
Collaborations
Canteloup has collaborated with notable individuals such as Jacky Mathias and Roland Kleim, contributing to the development of cutting-edge technologies.
Conclusion
Jean Canteloup's contributions to the field of three-dimensional measurements and observation have established him as a prominent inventor. His innovative patents and collaborations reflect his commitment to advancing technology in thin-film structure analysis.