Jay Jordan

Title: Innovations by Inventor Jay Jordan

Introduction

Jay Jordan is a notable inventor based in Beaverton, OR (US). He has made significant contributions to the field of sample preparation, particularly in the context of transmission electron microscopy (TEM). With a total of 2 patents, his work has advanced the methodologies used in extracting and preparing samples for analysis.

Latest Patents

Jay Jordan's latest patents focus on innovative methods for sample preparation. One patent describes techniques for extracting a TEM sample from a substrate, which includes milling a hole on the sample and inserting a probe into the hole. The sample adheres to the probe and can be processed while still attached. In another embodiment, the sample is freed from the substrate and adheres to the probe through electrostatic attraction, allowing it to be placed onto a TEM sample holder in a vacuum chamber.

Another patent outlines a method and apparatus for orienting samples for charged particle beam operations. In this invention, a sample is attached to a probe at a non-normal angle, and the probe shaft is rotated to reorient the sample. This method is particularly beneficial for preparing planar view TEM samples. The invention allows for a sample to be mounted to a TEM grid and thinned by an ion beam without removing the grid from the vacuum chamber.

Career Highlights

Jay Jordan has established himself as a key figure in his field through his innovative approaches to sample preparation. His work has been instrumental in enhancing the efficiency and effectiveness of TEM sample analysis.

Collaborations

He has collaborated with notable coworkers, including Liang Hong and Craig Henry, who have contributed to his research and development efforts.

Conclusion

Jay Jordan's contributions to the field of sample preparation have led to significant advancements in transmission electron microscopy. His innovative patents reflect his commitment to improving methodologies in scientific research.