The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 2009
Filed:
May. 25, 2006
Enrique Agorio, Portland, OR (US);
Michael Tanguay, Portland, OR (US);
Christophe Roudin, Hillsboro, OR (US);
Liang Hong, Hillsboro, OR (US);
Jay Jordan, Beaverton, OR (US);
Craig Henry, Aloha, OR (US);
Mark Darus, Hillsboro, OR (US);
Enrique Agorio, Portland, OR (US);
Michael Tanguay, Portland, OR (US);
Christophe Roudin, Hillsboro, OR (US);
Liang Hong, Hillsboro, OR (US);
Jay Jordan, Beaverton, OR (US);
Craig Henry, Aloha, OR (US);
Mark Darus, Hillsboro, OR (US);
FEI Company, Hillsboro, OR (US);
Abstract
Methods of extracting a TEM sample from a substrate include milling a hole on the sample and inserting a probe into the hole. The sample adheres to the probe, and can be processed on transferred while on the probe. In another embodiment, the sample is freed from a substrate and adheres to a probe by electrostatic attraction. The sample is placed onto a TEM sample holder in a vacuum chamber.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile