Brno, Czechia

Jaroslav Maniš

This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Fei Comapny. Active years: 2026.

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Jaroslav Maniš: Innovator in Support Structures for TEM

Introduction

Jaroslav Maniš is a notable inventor based in Brno, Czech Republic. He has made significant contributions to the field of materials science, particularly in the development of support structures for transmission electron microscopy (TEM). His innovative approach has led to advancements that enhance the capabilities of TEM in analyzing regions of interest.

Latest Patents

Jaroslav Maniš holds a patent for a "Support structure of inverted lamella for tall ROI." This invention involves lamellae with thin regions designed for TEM, which include oppositely situated S-shaped cut faces that define a waist region. In some examples, the waist has a thickness of less than 25 nm and defines a double tapered region with a height between 400 nm and 800 nm, making it suitable for TEM applications. Additionally, a portion of the lamella at the top surface can comprise a metallic or other coating that serves to support the lamella.

Career Highlights

Jaroslav Maniš is associated with Fei Company, where he applies his expertise in materials science and microscopy. His work has been instrumental in pushing the boundaries of what is possible in electron microscopy, allowing for more precise analysis of materials at the nanoscale.

Collaborations

Throughout his career, Jaroslav has collaborated with talented individuals such as Jaroslav Stárek and Jamie Dee Gravell. These collaborations have fostered an environment of innovation and have contributed to the success of his projects.

Conclusion

Jaroslav Maniš is a distinguished inventor whose work in support structures for TEM has made a significant impact in the field of materials science. His innovative patent and collaborations highlight his commitment to advancing technology in microscopy.

Profile summary based on public USPTO records.
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