Company Filing History:
Years Active: 2022-2024
Title: Jan Klusácek: Innovator in Charged Particle Microscopy
Introduction
Jan Klusácek is a notable inventor based in Brno, Czech Republic. He has made significant contributions to the field of charged particle microscopy, holding a total of 7 patents. His work focuses on innovative methods for examining samples using advanced microscopy techniques.
Latest Patents
Klusácek's latest patents include a method of examining a sample using a charged particle microscope. This invention involves providing a charged particle beam and scanning it over a sample at various locations. The emissions from the sample are detected, and spectral information is used to assign different phases to the sample. This method enhances the understanding of the sample's characteristics by establishing estimated phases based on previously assigned data.
Another significant patent is related to a method of examining a sample using a charged particle beam apparatus. This invention outlines a process for detecting emissions from the sample and acquiring spectral information. The method utilizes a spectral information prediction algorithm to predict spectral data based on detected emissions, allowing for efficient data gathering using a backscattered electron (BSE) detector.
Career Highlights
Jan Klusácek is currently associated with FEI Company, where he continues to develop innovative solutions in microscopy. His expertise in charged particle beam technology has positioned him as a key figure in advancing the capabilities of microscopy.
Collaborations
Klusácek has collaborated with notable colleagues such as Tomás Tůma and Jirí Petrek. These collaborations have contributed to the development of cutting-edge technologies in the field.
Conclusion
Jan Klusácek's contributions to charged particle microscopy through his patents and collaborations highlight his role as an influential inventor. His innovative methods are paving the way for advancements in sample examination techniques.