Geraardsbergen, Belgium

Jan De Beenhouwer

USPTO Granted Patents = 3 

 

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2024-2025

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3 patents (USPTO):Explore Patents

Title: Innovations by Jan De Beenhouwer

Introduction

Jan De Beenhouwer is a notable inventor based in Geraardsbergen, Belgium. He has made significant contributions to the field of item inspection through innovative methods and systems. With a total of two patents to his name, his work showcases the intersection of technology and practical applications in imaging systems.

Latest Patents

Jan De Beenhouwer's latest patents include "Item inspection by dynamic selection of projection angle" and "Item inspection by radiation imaging using an iterative projection-matching approach." The first patent describes a method for inspecting an item by acquiring a projection image using a radiation imaging system. It involves obtaining simulated projection images based on a three-dimensional model and determining the item's orientation relative to the imaging system. The method allows for the movement of the item or imaging system to acquire further projection images. The second patent presents a method and system for item inspection that involves acquiring multiple projection images at various angles for tomographic reconstruction. It focuses on detecting objects within the reconstruction and refining their positions and orientations through an iterative projection-matching approach.

Career Highlights

Throughout his career, Jan De Beenhouwer has worked with esteemed organizations such as the University of Antwerp and Imec Vzw. His experience in these institutions has contributed to his expertise in imaging technologies and item inspection methodologies.

Collaborations

Jan De Beenhouwer has collaborated with notable individuals in his field, including Jan Sijbers and Yu-Ting Ling. Their joint efforts have likely enhanced the development and application of innovative imaging techniques.

Conclusion

Jan De Beenhouwer's contributions to the field of item inspection through his patents and collaborations highlight his role as an influential inventor. His work continues to impact the advancement of imaging technologies.

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