Leiden, Netherlands

Jan Bonnet


Average Co-Inventor Count = 9.0

ph-index = 1

Forward Citations = 30(Granted Patents)


Company Filing History:


Years Active: 2006

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1 patent (USPTO):Explore Patents

Title: Jan Bonnet: Innovator in Automated Pathology Scanning

Introduction

Jan Bonnet is a notable inventor based in Leiden, Netherlands. He has made significant contributions to the field of pathology through his innovative automated scanning method for pathology samples. His work focuses on enhancing the efficiency and accuracy of analyzing cytology and histology samples.

Latest Patents

Jan Bonnet holds a patent for an automated scanning method that utilizes a flatbed scanner to capture high-resolution images of tumor cells and other structures of interest. This method allows for the analysis of common pathology staining techniques such as immunocytochemistry (ICC), immunohistochemistry (IHC), and in situ hybridization. The technology is designed to scan large volumes of material to identify cells or clusters that require further examination. If higher resolution analysis is needed, the system can transfer information about positive events to a secondary microscope for detailed review.

Career Highlights

Jan Bonnet is associated with Applied Imaging Corporation, where he continues to develop and refine his innovative scanning techniques. His work has the potential to revolutionize the way pathology samples are analyzed, making the process more efficient and reliable.

Collaborations

Jan collaborates with talented individuals in his field, including Nico Peter Verwoerd and Johannes Vrolijk. Their combined expertise contributes to the advancement of pathology technologies.

Conclusion

Jan Bonnet's contributions to automated pathology scanning represent a significant advancement in medical technology. His innovative methods enhance the analysis of pathology samples, paving the way for improved diagnostic processes.

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