The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 07, 2006
Filed:
Jun. 06, 2002
Nico Peter Verwoerd, Hazerswoude-Rijndijk, NL;
Johannes Vrolijk, Rijnsburg, NL;
Wilhelmina E. Mesker, Noordwijk, NL;
Willem C. R. Sloos, Hazerswoude-dorp, NL;
Jan Bonnet, Leiden, NL;
Padraig S. O'kelly, Wylam, GB;
Mark Gregson, Hexham, GB;
Kevin Shields, Tyne & Wear, GB;
Hendrikus J. Tanke, Rijnsburg, NL;
Nico Peter Verwoerd, Hazerswoude-Rijndijk, NL;
Johannes Vrolijk, Rijnsburg, NL;
Wilhelmina E. Mesker, Noordwijk, NL;
Willem C. R. Sloos, Hazerswoude-dorp, NL;
Jan Bonnet, Leiden, NL;
Padraig S. O'Kelly, Wylam, GB;
Mark Gregson, Hexham, GB;
Kevin Shields, Tyne & Wear, GB;
Hendrikus J. Tanke, Rijnsburg, NL;
Applied Imaging Corporation, Santa Clara, CA (US);
Abstract
Scanning and analysis of cytology and histology samples uses a flatbed scanner to capture images of the structures of interest such as tumor cells in a manner that results in sufficient image resolution to allow for the analysis of such common pathology staining techniques as ICC (immunocytochemistry), IHC (immunohistochemistry) or in situ hybridization. Very large volumes of such material are scanned in order to identify cells or clusters of cells which are positive or warrant more detailed examination, and if analysis at higher resolution is necessary, information regarding these positive events is transferred to a secondary microscope, such as a conventional scanning microscope, to allow further analysis and review of the selected regions of the slide containing the sample.