Santa Clara, CA, United States of America

Applied Imaging Corporation

Calculating rank
USPTO Granted Patents = 16

Trademarks = 1

Forward Citations = 977

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26 inventors (with patents filed for the assignee):

goldMedal Alexander M Saunders (4 out of 7 patents)

silverMedal Ilya Ravkin (3 out of 8 patents)

bronzeMedal Michael A Zarowitz (2 out of 9 patents)

4.  Jacques Ginestet (2 out of 2 patents)

5.  Patricia J Baldwin (2 out of 2 patents)

6.  Mitchell Golbus (2 out of 2 patents)

7.  Kevin Shields (1 out of 3 patents)

8.  Simon Goldbard (1 out of 4 patents)

9.  William Hughes (1 out of 1 patent)

10.  Duncan William Borthwick (1 out of 2 patents)

11.  Nico Peter Verwoerd (1 out of 1 patent)

12.  Wilhelmina E Mesker (1 out of 1 patent)

13.  Johannes Vrolijk (1 out of 1 patent)

14.  Willem C R Sloos (1 out of 1 patent)

15.  Padraig S O'Kelly (1 out of 1 patent)


16 patents:

Company Overview
Applied Imaging Corporation, based in Santa Clara, California, specializes in advanced imaging solutions and technologies. The company focuses on developing innovative products that enhance imaging capabilities across various sectors, including healthcare and industrial applications. With a commitment to research and development, Applied Imaging leverages cutting-edge technology to deliver high-quality imaging systems that meet the evolving needs of its clients, ensuring precision and reliability in critical imaging tasks.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 20 2026

16 Patents

#204 in Santa Clara, CA

#4,777 in California

#19,935 in US

#37,868 in the World

Santa Clara, CA (US)
Santa Clara, CA, United States of America
Forward Citations = 977

26 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Applied Imaging Corporation. Retrieved from https://idiyas.com/company/applied-imaging

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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