San Jose, CA, United States of America

Jamie Tu


Average Co-Inventor Count = 3.5

ph-index = 3

Forward Citations = 99(Granted Patents)


Company Filing History:


Years Active: 2005-2023

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5 patents (USPTO):Explore Patents

Title: Innovations of Jamie Tu

Introduction

Jamie Tu is an accomplished inventor based in San Jose, California. He has made significant contributions to the field of technology, particularly in the area of calibration systems and data measurement methods. With a total of five patents to his name, Jamie has established himself as a key figure in his industry.

Latest Patents

Among his latest patents is a "System and method for calibrating vector network analyzer modules." This innovative system dynamically assigns match utilization to improve overall calibration accuracy. It also addresses issues arising from a non-optimal set of calibration components and simplifies user input requirements during the calibration process. Another notable patent is the "Method for marking data in time/frequency measurement." This method involves marking relevant data within an acquired set of data by receiving the location of a first synchronization event. The process includes searching for the synchronization event, identifying it, and obtaining data from the acquired set within a determined offset range.

Career Highlights

Jamie Tu currently works at Anritsu Company, where he continues to develop cutting-edge technologies. His work has been instrumental in enhancing the performance and accuracy of measurement systems. His innovative approaches have garnered attention and respect within the engineering community.

Collaborations

Jamie collaborates with talented individuals such as Jon Martens and Elena Vayner, who contribute to the dynamic environment at Anritsu Company. Their combined expertise fosters a culture of innovation and excellence.

Conclusion

Jamie Tu's contributions to technology through his patents and collaborative efforts highlight his role as a leading inventor in his field. His work continues to influence advancements in calibration systems and data measurement methods.

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