The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 19, 2019

Filed:

Oct. 22, 2014
Applicant:

Anritsu Company, Morgan Hill, CA (US);

Inventors:

Jon Martens, San Jose, CA (US);

David Judge, Cupertino, CA (US);

Jamie Tu, San Jose, CA (US);

Assignee:

ANRITSU COMPANY, Morgan Hill, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 13/02 (2006.01); G01R 31/317 (2006.01); G11B 27/30 (2006.01); G11B 20/18 (2006.01);
U.S. Cl.
CPC ...
G01R 13/0254 (2013.01); G01R 31/31726 (2013.01); G11B 20/18 (2013.01); G11B 27/3027 (2013.01);
Abstract

A method for marking relevant data within an acquired set of data in accordance with an embodiment includes receiving a location of a first synchronization event within a synchronizing time pulse synchronized with the acquired set of data, searching the synchronizing time pulse within a predetermined window for the first synchronization event based on the location, identifying the first synchronization event based on the search, and obtaining data from the acquired set of data within an offset range determined based on the identified first synchronization event. The steps are then iteratively repeated for a number of periods.


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