The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 17, 2023
Filed:
Mar. 22, 2021
Applicant:
Anritsu Company, Morgan Hill, CA (US);
Inventors:
Jon Martens, San Jose, CA (US);
Gary Chock, San Jose, CA (US);
Jamie Tu, San Jose, CA (US);
Elena Vayner, San Jose, CA (US);
Amruth Sai Gandavarapu, San Jose, CA (US);
Mrunal Damle, Sunnyvale, CA (US);
Assignee:
Anritsu Company, Morgan Hill, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/309 (2015.01); H04B 17/14 (2015.01);
U.S. Cl.
CPC ...
H04B 17/309 (2015.01); H04B 17/14 (2015.01);
Abstract
Systems and methods for calibrating VNA modules which dynamically assigns match utilization to improve overall calibration accuracy and reduce problems from a non-optimal set of calibration components and simplify user input requirements during calibration.
Martens, Jon. (2023). System and method for calibrating vector network analyzer modules (U.S. Patent No. 11558129). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11558129
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile