The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 05, 2019

Filed:

Feb. 24, 2017
Applicant:

Anritsu Company, Morgan Hill, CA (US);

Inventors:

Jon S. Martens, San Jose, CA (US);

Elena Vayner, San Jose, CA (US);

Jamie Tu, San Jose, CA (US);

Assignee:

ANRITSU COMPANY, Morgan Hill, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/28 (2006.01); H04L 7/033 (2006.01); H04L 12/26 (2006.01); G01R 31/00 (2006.01);
U.S. Cl.
CPC ...
H04L 7/033 (2013.01); G01R 27/28 (2013.01); H04L 43/50 (2013.01); G01R 31/001 (2013.01);
Abstract

A system for obtaining measurements for a device under test (DUT) includes a vector network analyzer including a storage medium and a controller for controlling a sweep and a trigger driver configured to provide a synchronization signal to the DUT and the controller to synchronize internal signal components of the vector network analyzer including signal sources, local oscillators (LOs) and an analog-to-digital converter (ADC) clock. A signal is received by the vector network analyzer in response to a test signal generated and transmitted to the DUT. Data related to the received signal is acquired and stored in at the storage medium. The controller inserts a mark into the time record based on an event of the sweep for identifying data from the received signal associated with the event within the time record.


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