This inventor holds 13 USPTO granted patents. Top assignee: Adv Antest Corporation. Active years: 1999-2005.
Location History:
- Chicago, IL (US) (1999 - 2004)
- Highland Park, IL (US) (2005)
Company Filing History:
Years Active: 1999-2005
Title: James Warren Frame: Innovator in Semiconductor Testing Technology
Introduction
James Warren Frame is a notable inventor based in Chicago, IL, with a remarkable portfolio of 13 patents. His contributions primarily focus on advancements in semiconductor testing technology, showcasing his expertise and innovative spirit in the field.
Latest Patents
One of Frame's latest patents is a comparator circuit for a semiconductor test system. This circuit is designed to compare differential output signals of a semiconductor device under test (DUT). It consists of a first pair of comparators, including a DC comparator and an AC comparator, which receive a first differential signal. Additionally, there is a second pair of comparators that also includes a DC comparator and an AC comparator for a second differential signal. The circuit features latches for output and serial-parallel converters to transform output signals into parallel signals, all formed of discrete components on a dielectric substrate.
Another significant patent is the universal test interface between a DUT and a test head. This modular interface includes a board spacer with an array of connectors, allowing for high-speed and high-fidelity connections between the test head and devices on the DUTs. This design accommodates various DUT types, ensuring consistent connection points and supporting frequencies exceeding 50 MHz.
Career Highlights
James Warren Frame is currently associated with Adv Antest Corporation, where he continues to innovate in semiconductor testing solutions. His work has significantly impacted the efficiency and accuracy of testing processes in the semiconductor industry.
Collaborations
Frame has collaborated with notable colleagues, including Theodore A. Khoury and Mark R. Jones, contributing to the development of advanced testing technologies.
Conclusion
James Warren Frame's innovative contributions to semiconductor testing technology have established him as a key figure in the field. His patents reflect a commitment to enhancing testing methodologies, ensuring high performance and reliability in semiconductor devices.