James Peter McNiven

Title: Innovations of James Peter McNiven

Introduction

James Peter McNiven is a notable inventor based in Vail, Arizona, with a remarkable portfolio of ten patents. His work primarily focuses on advanced surface inspection systems, showcasing his expertise in optical technologies and measurement capabilities.

Latest Patents

One of McNiven's latest patents is the "Front Quartersphere Scattered Light Analysis," which presents a sophisticated surface inspection system. This system includes several subsystems, such as a beam source subsystem, a beam scanning subsystem, a workpiece movement subsystem, an optical collection and detection subsystem, and a processing subsystem. The optical collection and detection system features a light channel assembly designed to collect light reflected from the surface of the workpiece. Additionally, it incorporates front collectors and wing collectors to gather light scattered from the surface, significantly enhancing the measurement capabilities of the system. The light channel assembly is equipped with a switchable edge exclusion mask and a reflected light detection system, which improves the detection of reflected light.

Career Highlights

Throughout his career, McNiven has made significant contributions to the field of optical inspection technologies. He has worked with prominent companies, including Kla Tencor Corporation and Kla-Tencor Technologies Corporation, where he has applied his innovative ideas to develop cutting-edge solutions.

Collaborations

Some of McNiven's notable coworkers include Richard Earl Bills and Neil Judell, who have collaborated with him on various projects, further enhancing the impact of his inventions.

Conclusion

James Peter McNiven's contributions to surface inspection technology through his patents and collaborations highlight his role as a leading inventor in the field. His innovative systems continue to push the boundaries of optical measurement and inspection.