Owings Mills, MD, United States of America

James F Plusquellic

This inventor holds 2 USPTO granted patents. Top assignee: International Business Machines Corporation. Active years: 2008-2009.

IDiyas Innovation Intelligence. (2026). Inventor Profile: James F Plusquellic. Retrieved from https://idiyas.com/inventor/james-f-plusquellic

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 50.0

Average Co-Inventor Count = 6.0

ph-index = 2

Forward Citations = 11(Granted Patents)


Company Filing History:


Years Active: 2008-2009

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2 patents (USPTO):Explore Patents

Title: James F Plusquellic: Innovator in Device Mismatch Measurement

Introduction

James F Plusquellic is a notable inventor based in Owings Mills, MD (US). He has made significant contributions to the field of device mismatch measurement, holding a total of 2 patents. His work primarily focuses on enhancing the accuracy and efficiency of statistical characterization in electronic devices.

Latest Patents

James F Plusquellic's latest patents include a method and apparatus for measuring device mismatches. This innovative test structure is designed for the statistical characterization of local device mismatches. It features densely populated SRAM devices arranged in a row/column addressable array, which enables resource sharing among many devices. The test structure incorporates a built-in sensing mechanism to calibrate or null out sources of error. Additionally, it employs current steering to mitigate the negative effects of current leakage along spurious paths. The gate and drain lines of each column are driven from both the top and bottom, minimizing parasitic effects. This system is capable of handling a large number of devices while still providing high spatial resolution of current measurements.

Career Highlights

James F Plusquellic is currently associated with International Business Machines Corporation (IBM). His work at IBM has allowed him to push the boundaries of technology in device mismatch measurement. His contributions have been instrumental in advancing the field and improving the reliability of electronic devices.

Collaborations

James has collaborated with notable coworkers such as Chandler Todd McDowell and Kanak Behari Agarwal. These collaborations have fostered innovation and have led to significant advancements in their respective fields.

Conclusion

James F Plusquellic is a distinguished inventor whose work in measuring device mismatches has made a lasting impact on technology. His innovative patents and contributions to IBM highlight his commitment to advancing the field of electronics.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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