This inventor holds 2 USPTO granted patents. Top assignee: International Business Machines Corporation. Active years: 2008-2009.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2008-2009
Title: James F Plusquellic: Innovator in Device Mismatch Measurement
Introduction
James F Plusquellic is a notable inventor based in Owings Mills, MD (US). He has made significant contributions to the field of device mismatch measurement, holding a total of 2 patents. His work primarily focuses on enhancing the accuracy and efficiency of statistical characterization in electronic devices.
Latest Patents
James F Plusquellic's latest patents include a method and apparatus for measuring device mismatches. This innovative test structure is designed for the statistical characterization of local device mismatches. It features densely populated SRAM devices arranged in a row/column addressable array, which enables resource sharing among many devices. The test structure incorporates a built-in sensing mechanism to calibrate or null out sources of error. Additionally, it employs current steering to mitigate the negative effects of current leakage along spurious paths. The gate and drain lines of each column are driven from both the top and bottom, minimizing parasitic effects. This system is capable of handling a large number of devices while still providing high spatial resolution of current measurements.
Career Highlights
James F Plusquellic is currently associated with International Business Machines Corporation (IBM). His work at IBM has allowed him to push the boundaries of technology in device mismatch measurement. His contributions have been instrumental in advancing the field and improving the reliability of electronic devices.
Collaborations
James has collaborated with notable coworkers such as Chandler Todd McDowell and Kanak Behari Agarwal. These collaborations have fostered innovation and have led to significant advancements in their respective fields.
Conclusion
James F Plusquellic is a distinguished inventor whose work in measuring device mismatches has made a lasting impact on technology. His innovative patents and contributions to IBM highlight his commitment to advancing the field of electronics.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
