International Business Machines Corporation

James F Plusquellic

Kanak Behari Agarwal

Ying Liu

Sani Richard Nassif

Chandler Todd McDowell

Jayakumaran Sivagnaname

A test structure for statistical characterization of local device mismatches contains densely populated SRAM devices arranged in a row/column addressable array that enables resource sharing of many devices. The test structure includes a built-in sensing mechanism to calibrate or null out sources of error, and current steering to avoid negative effects of current leakage along spurious paths. The gate and drain lines of each column are driven from both the top and bottom to minimizes parasitic effects. The system can handle a large number of devices while still providing high spatial resolution of current measurements.

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Owing Mills, MD, United States of America

James F Plusquellic