Company Filing History:
Years Active: 2004-2018
Title: The Innovations of James B. Kerr
Introduction
James B. Kerr is an accomplished inventor based in Santa Rosa, CA (US). He holds a total of 3 patents that showcase his expertise in the field of noise measurement and radio frequency systems. His innovative contributions have significantly impacted the technology landscape.
Latest Patents
One of his latest patents is titled "Noise figure measurement using narrowband compensation." This method involves determining a noise figure (NF) response of a device under test (DUT) by measuring the frequency response of a noise receiver and the gain of the DUT over specific frequency ranges. The process also includes measuring the output-noise power of the DUT and estimating its gain to determine the NF response accurately.
Another notable patent is the "System and method for image signal rejection." This invention describes a radio frequency (RF) measurement system that acts as a spectrum analyzer. It eliminates image signals from a detected input RF spectrum by determining local oscillator (LO) frequencies and mixing them with the input RF spectrum to provide corresponding intermediate frequency (IF) signals. The method further includes acquiring ADC time records and performing Fourier transforms to detect RF responses.
Career Highlights
James B. Kerr has worked with prominent companies such as Keysight Technologies, Inc. and Agilent Technologies, Inc. His experience in these organizations has allowed him to develop and refine his innovative ideas, contributing to advancements in measurement technologies.
Collaborations
Throughout his career, James has collaborated with talented individuals, including Joel P. Dunsmore and Sean Hubert. These partnerships have fostered a creative environment that has led to significant technological advancements.
Conclusion
James B. Kerr's contributions to the field of technology through his patents and collaborations highlight his role as a significant inventor. His work continues to influence advancements in noise measurement and RF systems.