The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 10, 2018

Filed:

Apr. 24, 2014
Applicant:

Keysight Technologies, Inc., Minneapolis, MN (US);

Inventors:

David J. Ballo, Santa Rosa, CA (US);

James B. Kerr, Santa Rosa, CA (US);

Robert E. Shoulders, Santa Rosa, CA (US);

Assignee:

Keysight Technologies, Inc., Santa Rosa, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 29/26 (2006.01); G01R 23/20 (2006.01); G01R 27/28 (2006.01);
U.S. Cl.
CPC ...
G01R 29/26 (2013.01); G01R 23/20 (2013.01); G01R 27/28 (2013.01);
Abstract

A method of determining a noise figure (NF) response of a device under test (DUT) comprises determining a frequency response of a noise receiver over a first frequency range, measuring a gain of the DUT over a second frequency range encompassing the first frequency range, measuring output-noise power of the DUT over the second frequency range, determining an estimated gain of the DUT based on the frequency response of the noise receiver and the gain of the DUT over the first frequency range, and determining the NF response of the DUT over the second frequency range based on the estimated gain and the output-noise power.


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