The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 13, 2017
Filed:
May. 12, 2015
Keysight Technologies, Inc., Minneapolis, MN (US);
Joel P. Dunsmore, Sebastopol, CA (US);
Jean-Pierre Teyssier, Santa Rosa, CA (US);
Jad Faraj, Santa Rosa, CA (US);
James B. Kerr, Santa Rosa, CA (US);
Keysight Technologies, Inc., Santa Rosa, CA (US);
Abstract
A radio frequency (RF) measurement system acting as a spectrum analyzer and a method of operating the same eliminates image signals from a detected input RF spectrum. The method includes determining at least three local oscillator (LO) frequencies; determining LO offsets between the LO frequencies; and mixing the LO frequencies with the input RF spectrum to provide corresponding intermediate frequency (IF) signals having an IF bandwidth, where at least one of the IF signals has the input RF spectrum mixed to a different portion of the IF bandwidth than at least one other of the IF signals, providing overlapping coverage. The method further includes acquiring ADC time records for the IF signals; performing Fourier transforms (FTs) on the ADC time records to provide IF spectrums; and detecting RF responses from the IF spectrums to determine an RF response trace corresponding to the input RF spectrum.