This inventor holds 1 USPTO granted patent. Top assignee: Intel Corporation. Active years: 2022.
Company Filing History:
Years Active: 2022
Title: Jacob Woolsey - Innovator in Semiconductor Technology
Introduction
Jacob Woolsey is a notable inventor based in Mesa, AZ (US). He has made significant contributions to the field of semiconductor technology. His innovative approach has led to the development of a unique method for detecting defects in semiconductor dies.
Latest Patents
Jacob Woolsey holds a patent for a "Method, device and system for non-destructive detection of defects in a semiconductor die." This patent describes a method that includes positioning an emitter above the semiconductor die. The method generates an emitted wave directed to a focal point on the surface of the die. It also involves generating a reflected wave from the focal point, which acts as a point source reflecting the emitted wave. A receiver is positioned above the die to receive the reflected wave, and the method measures the reflected wave to detect modulations in amplitude.
Career Highlights
Jacob Woolsey is currently employed at Intel Corporation, where he continues to innovate in semiconductor technology. His work has been instrumental in advancing non-destructive testing methods, which are crucial for ensuring the reliability of semiconductor devices.
Collaborations
Jacob collaborates with talented coworkers, including Deepak Goyal and Odissei Touzanov. Their combined expertise contributes to the success of their projects at Intel Corporation.
Conclusion
Jacob Woolsey is a pioneering inventor whose work in semiconductor technology has the potential to revolutionize the industry. His patent for non-destructive detection methods showcases his innovative spirit and commitment to advancing technology.