J K Leong

Title: J K Leong: Innovator in Optical Surface Defect Characterization

Introduction

J K Leong is a prominent inventor based in San Jose, California, known for his contributions to the field of optical surface defect characterization. With a total of three patents to his name, Leong has made significant advancements in methods and systems for detecting and classifying defects in materials.

Latest Patents

Leong's latest patents focus on innovative techniques for optical surface defect material characterization. One of his notable inventions describes methods and systems for detecting and classifying defects based on the phase of dark field scattering from a sample. This invention enhances throughput by allowing defects to be detected and classified using the same optical system. The classification of defects is achieved by measuring the relative phase of scattered light collected from at least two spatially distinct locations in the collection pupil. The phase difference between the light transmitted through these locations is indicative of the material composition of the sample. Another patent outlines an inspection system that includes an illumination source, focusing elements, and a detection mode control device, which together enable the classification of defects based on scattering characteristics.

Career Highlights

Throughout his career, J K Leong has worked with notable companies such as KLA-Tencor Corporation and KLA Corporation. His experience in these organizations has contributed to his expertise in optical systems and defect characterization.

Collaborations

Leong has collaborated with esteemed colleagues, including Guoheng Zhao and Michael D. Kirk, further enhancing his work in the field of optical defect detection.

Conclusion

J K Leong's innovative patents and career achievements highlight his significant contributions to the field of optical surface defect characterization. His work continues to influence advancements in material inspection technologies.