This inventor holds 1 USPTO granted patent. Top assignees: Kaijo Denki Co. Ltd., View Engineering, Inc.. Active years: 1989.
Company Filing History:
1 out of 7 
1 out of 13 Years Active: 1989
Title: Iwami Uramoto: Innovator in Semiconductor Device Inspection
Introduction
Iwami Uramoto is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of semiconductor technology, particularly in the area of inspection systems. His innovative approach has led to advancements that enhance the accuracy and efficiency of semiconductor device inspections.
Latest Patents
Uramoto holds a patent for a semiconductor device inspection system. This system is designed to objectively accomplish visual image inspection of semiconductor devices while minimizing errors. It effectively carries out inspections with high accuracy and speed. The system features a low magnification image pickup mechanism that includes multiple units for generating image signals. Additionally, it incorporates a signal processing system to assess the correctness of the semiconductor device. The arrangement of light receptors in the image pickup units is strategically designed to optimize the inspection process.
Career Highlights
Throughout his career, Uramoto has worked with several prominent companies, including View Engineering, Inc. and Kaijo Denki Co. Ltd. His experience in these organizations has contributed to his expertise in semiconductor technology and inspection systems.
Collaborations
Uramoto has collaborated with notable professionals in his field, including Valerie A Liudzius and Ralph M Weisner. These collaborations have further enriched his work and contributed to the development of innovative solutions in semiconductor inspection.
Conclusion
Iwami Uramoto's contributions to semiconductor device inspection technology highlight his role as an influential inventor. His patented system exemplifies the importance of innovation in enhancing the accuracy and efficiency of inspections in the semiconductor industry.