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For the Inventor, By the Inventor

Miyazaki, Japan

Itsuro Iwakiri

This inventor holds 6 USPTO granted patents. Top assignee: Oki Electric Industry Co., Ltd.. Active years: 1994-1999.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Itsuro Iwakiri. Retrieved from https://idiyas.com/inventor/itsuro-iwakiri

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 6

% Patents Active = 100.0

Average Co-Inventor Count = 1.1

ph-index = 4

Forward Citations = 82(Granted Patents)


Company Filing History:

goldMedal6 out of 4,980 
 
Oki Electric Industry Co., Ltd.
 patents

Years Active: 1994-1999

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6 patents (USPTO):Explore Patents
1. 5930186 - Method and apparatus for testing counter and serial access memory (1999-07-27),
2. 5805514 - Method for testing a semiconductor memory device and a semiconductor (1998-09-08),
3. 5801981 - Serial access memory with reduced loop-line delay (1998-09-01),
4. 5781481 - Semiconductor memory device with reduced leakage current and improved (1998-07-14),
5. 5361236 - Serial access memory (1994-11-01),
6. 5321661 - Self-refreshing memory with on-chip timer test circuit (1994-06-14),

Title: Innovations of Itsuro Iwakiri

Introduction

Itsuro Iwakiri is a notable inventor based in Miyazaki, Japan. He has made significant contributions to the field of semiconductor technology, holding a total of 6 patents. His work focuses on methods and apparatuses for testing semiconductor memory devices, showcasing his expertise in this specialized area.

Latest Patents

One of his latest patents is a method and apparatus for testing counter and serial access memory. In this method, the counter is initially set to a predetermined value and incremented in response to clock signals. The number of clocks is counted until a carry is outputted from the counter, providing an actual counted value. This value is then compared to a reference value calculated in advance, allowing for the determination of whether the counter is operating normally.

Another significant patent involves a method for testing a semiconductor memory device. This invention includes a clock generating circuit and a control circuit. The clock generating circuit produces a clock signal in response to an operation request signal, while the control circuit generates a reset signal to stop the clock signal after a predetermined time. The test is initiated by inputting a test mode signal, allowing for the detection of failures that may only appear during long cycle operations.

Career Highlights

Iwakiri is currently employed at Oki Electric Industry Co., Ltd., where he continues to innovate in the field of semiconductor technology. His work has been instrumental in advancing testing methods for semiconductor devices, contributing to the reliability and efficiency of these technologies.

Collaborations

Iwakiri collaborates with Shinichiro Sato, enhancing the innovative capabilities within their projects. Their combined expertise fosters a productive environment for developing cutting-edge solutions in semiconductor testing.

Conclusion

Itsuro Iwakiri's contributions to semiconductor technology through his patents and collaborations highlight his role as a significant inventor in the field. His innovative methods for testing memory devices continue to impact the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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