The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 27, 1999
Filed:
Oct. 28, 1997
Applicant:
Inventor:
Itsuro Iwakiri, Miyazaki, JP;
Assignee:
Oki Electric Industry Co., Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C / ;
U.S. Cl.
CPC ...
365201 ; 365221 ; 365239 ;
Abstract
In a method for testing a counter, the counter is first set at a predetermined initial value. Then, the counter is incremented in response to the clocks. The number of the clocks is counted until a carry is outputted from the counter to provide an actual counted value. The actual counted value is compared to a reference value, which is calculated in advance. And then, the counter is decided whether to be operating normally or not on the basis of the result of the comparison.
Quick Actions:
Iwakiri, Itsuro. (1999). Method and apparatus for testing counter and serial access memory (U.S. Patent No. 5930186). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5930186
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile