Location History:
- Rohovot, IL (2016)
- Rehovot, IL (2018 - 2019)
Company Filing History:
Years Active: 2016-2019
Title: The Innovations of Itay Zauer
Introduction
Itay Zauer is a notable inventor based in Rehovot, Israel. He has made significant contributions to the field of multilayer structures, holding a total of three patents. His work focuses on advanced techniques for measuring overlay between layers, which is crucial in various technological applications.
Latest Patents
One of Itay Zauer's latest patents is a technique for measuring overlay between layers of a multilayer structure. This method involves obtaining a given image that represents the multilayer structure and expected images for the individual layers. The process includes providing a combined expected image of the multilayer structure, performing registration of the given image against this combined expected image, and providing segmentation of the given image. This results in a segmented image and maps of the layers within the multilayered structure. Furthermore, the method allows for determining the overlay between any two selected layers by processing the maps of these layers alongside their expected images.
Career Highlights
Itay Zauer is currently employed at Applied Materials Israel Limited, where he continues to innovate and develop new technologies. His expertise in multilayer structures has positioned him as a key player in his field.
Collaborations
He has collaborated with notable coworkers, including Yakov Weinberg and Ishai Schwarzband, contributing to various projects and advancements in technology.
Conclusion
Itay Zauer's work exemplifies the importance of innovation in technology, particularly in the measurement and analysis of multilayer structures. His contributions through patents and collaborations continue to influence the industry positively.