Company Filing History:
Years Active: 2003-2004
Title: Ira Rosenberg: Innovator in Electron Microscopy
Introduction
Ira Rosenberg is a notable inventor based in Andover, MA (US). He has made significant contributions to the field of electron microscopy, holding 2 patents that enhance the functionality and precision of scanning electron microscopes.
Latest Patents
Rosenberg's latest patents include "Reduction of aberrations produced by Wien filter in a scanning electron microscope and the like." This invention aims to improve the resolution of an electron beam by ensuring that the beam has an envelope with a crossover point within, ideally centrally located with respect to the Wien filter. His second patent, "Wien filter for use in a scanning electron microscope or the like," describes a charged particle filter where the components are securely attached to a supporting structure, minimizing adverse effects on the magnetic field.
Career Highlights
Ira Rosenberg is currently employed at Schlumberger Technologies, Inc., where he continues to innovate in the field of electron microscopy. His work has been instrumental in advancing the technology used in particle detection.
Collaborations
Rosenberg has collaborated with notable colleagues such as Neal T Sullivan and Paul J Duval, contributing to a dynamic work environment that fosters innovation.
Conclusion
Ira Rosenberg's contributions to electron microscopy through his patents and collaborations highlight his role as a significant inventor in the field. His work continues to influence advancements in technology and research.