Gwalior, India

Inder Mohan Bhawnani

This inventor holds 1 USPTO granted patent. Top assignee: Nxp USA, Inc.. Active years: 2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Inder Mohan Bhawnani. Retrieved from https://idiyas.com/inventor/inder-mohan-bhawnani

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2018

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1 patent (USPTO):Explore Patents

Title: Inder Mohan Bhawnani: Innovator in Design Rule Verification

Introduction

Inder Mohan Bhawnani is a notable inventor based in Gwalior, India. He has made significant contributions to the field of design rule verification, showcasing his expertise through his innovative patent.

Latest Patents

Inder Mohan Bhawnani holds a patent titled "Method for verifying design rule checks." This method provides a systematic approach to design rule verification, which includes creating a design rule check (DRC) deck based on a design rule manual (DRM) that encompasses multiple design rules. The process involves providing primitive objects, creating collection objects, and generating DRM test cases to verify the DRC deck effectively.

Career Highlights

Inder is currently employed at NXP USA, Inc., where he applies his skills and knowledge in the field of design verification. His work has contributed to advancements in ensuring the integrity and reliability of design processes.

Collaborations

Inder has collaborated with notable colleagues, including Ertugrul Demircan and Dwarka Prasad, enhancing the innovation landscape through teamwork and shared expertise.

Conclusion

Inder Mohan Bhawnani's contributions to design rule verification exemplify his commitment to innovation in technology. His patent and career at NXP USA, Inc. highlight his role as a significant figure in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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