Kanata, Canada

Iman Abdali Mashhadi

USPTO Granted Patents = 3 

Average Co-Inventor Count = 1.8

ph-index = 1


Company Filing History:


Years Active: 2025

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3 patents (USPTO):Explore Patents

Title: Iman Abdali Mashhadi: Innovator in Wafer Screening Technology

Introduction

Iman Abdali Mashhadi is a notable inventor based in Kanata, Canada. He has made significant contributions to the field of semiconductor technology, particularly in wafer screening processes. With a total of 3 patents to his name, his work has advanced the efficiency and accuracy of wafer testing.

Latest Patents

Iman's latest patents include innovative methods for automatic maverick wafer screening and wafer testing for current properties of power transistors. The first patent focuses on automatic maverick screening of a subject wafer, where an inspection pass status is acquired for each die on the wafer. By comparing the pass/fail percentages of multiple zones with expected values based on historical data, the system can identify maverick wafers with high precision. The second patent involves wafer testing of a power transistor using a sense transistor constructed from the same epitaxial stack. This method allows for accurate measurement of the current properties of the power transistor under simulated operating conditions.

Career Highlights

Iman Abdali Mashhadi is currently employed at Infineon Technologies Canada Inc., where he continues to develop cutting-edge technologies in the semiconductor industry. His expertise in wafer screening and testing has positioned him as a valuable asset to his team and the company.

Collaborations

Throughout his career, Iman has collaborated with talented professionals, including Regina Inyangat Akudo and Thomas William Macelwee. These collaborations have fostered an environment of innovation and creativity, leading to advancements in their respective fields.

Conclusion

Iman Abdali Mashhadi's contributions to wafer screening technology exemplify his dedication to innovation in the semiconductor industry. His patents reflect a commitment to improving testing processes, which ultimately enhances the performance of electronic devices.

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